Facilities

Semiconductor and Nanostructures Epitaxy:

1. Molecular Beam Epitaxy-I: Perkin Elmer 425B system

2. Molecular Beam Epitaxy-II: SVTA system

3. Molecular Beam Epitaxy-III:

Home-built system for quantum structures

Materials and Devices Characterization:

1. I-V probe station (Agilent 4155,

Signatone prober, function generators)

2. LCR Meter (Agilent 4284A)

3. Photocurrent Spectroscopy

4. Photoluminescence and Electroluminescence

5. Hall-effect Measurement System

6. LED Measurement System

Other materials and devices characterization capability available in UCR:

1) Analytical Microscopy User Facility, including SEM and TEM

2) UCR Optical User Facility, including XRD, FTIR, Raman Spectroscopy, Scanning UV/VIS/IR Spectrophotometer, etc.

Materials Processing and Device Packaging:

	2. Hybond 572A Wedge wire bonder

Device Fabrication:

1. UCR Clean Room

2. UCLA Nanofabrication User Facility

3. Stanford Nanofabrication Facility